RT Journal Article
T1 Implementing concurrent error detection in infinite-impulse-response filters
A1 Reviriego, Pedro
A1 Ruano Ramos, Óscar
A1 Maestro De La Cuerda, Juan Antonio
AB Advanced electronic circuits suffer errors caused by multiple sources. For example, radiation can induce transient errors, and manufacturing variations can cause some devices to sporadically suffer errors. Fault tolerance is therefore an important issue in advanced electronic circuits. Digital filters are commonly used in many applications, and therefore, their protection against errors has been widely studied. However, infinite-impulse-response (IIR) filters have received little attention as most of the existing works focus on finite-impulse-response filters. In this brief, a technique to implement concurrent error detection in IIR filters with programmable coefficients is proposed and evaluated. The protection effectiveness is assessed through fault injection experiments that show that it can efficiently detect errors. The cost is estimated using the synthesis results for a 45-nm library. The results show that the area overhead is much lower than that of a duplicated system that can also detect errors.
PB IEEE
YR 2012
FD 2012
LK https://hdl.handle.net/20.500.14352/110022
UL https://hdl.handle.net/20.500.14352/110022
LA eng
NO P. Reviriego, O. Ruano and J. A. Maestro, "Implementing Concurrent Error Detection in Infinite-Impulse-Response Filters," in IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 59, no. 9, pp. 583-586, Sept. 2012, doi: 10.1109/TCSII.2012.2208676. keywords: {Finite impulse response filter;Registers;Fault tolerant systems;Redundancy;Circuit faults;Concurrent error detection (CED);filter;infinite impulse response (IIR)},
NO Ministerio de Educación, Cultura y Deporte (España)
DS Docta Complutense
RD 10 abr 2025