TY  - JOUR
AU  - Reviriego, Pedro
AU  - Ruano Ramos, Óscar
AU  - Maestro De La Cuerda, Juan Antonio
PY  - 2012
DO  - 10.1109/TCSII.2012.2208676
UR  - https://hdl.handle.net/20.500.14352/110022
T2  - IEEE Transactions on Circuits and Systems II: Express Briefs
AB  - Advanced electronic circuits suffer errors caused by multiple sources. For example, radiation can induce transient errors, and manufacturing variations can cause some devices to sporadically suffer errors. Fault tolerance is therefore an important...
LA  - eng
M2  - 583
PB  - IEEE
TI  - Implementing concurrent error detection in infinite-impulse-response filters
TY  - journal article
VL  - 59
ER  -