TY  - CHAP
AU  - Miranda Pantoja, José Miguel
AU  - Muñoz San Martín, Sagrario
AU  - Sebastián Franco, José Luis
PY  - 2001
SN  - 0-7803-6646-8
UR  - https://hdl.handle.net/20.500.14352/60814
AB  - This paper presents a procedure for an accurate characterization of parasitic effects of terminal pads in microwave devices. This procedure is based on the measurement of S and Noise parameters of the device with two different sets of calibration...
LA  - eng
M2  - 530
PB  - IEEE
KW  - Signal.
TI  - Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques
TY  - book part
VL  - 1-3
ER  -