RT Journal Article
T1 Degradation of instrumentation amplifiers due to the nonionizing energy loss damage
A1 Franco Peláez, Francisco Javier
A1 Lozano Rogado, Jesús
A1 Santos Blanco, José Pedro
A1 Agapito Serrano, Juan Andrés
AB Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. The radiation tolerance is bigger in amplifiers with JFET input stage or with large frequency bandwidth and is smaller if the amplifier has been designed for reducing the power consumption. The IAs built with OPAMPs have a higher tolerance than the commercial ones, but they have disadvantages: high temperature influence, low CMRR, etc.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 0018-9499
YR 2003
FD 2003-12
LK https://hdl.handle.net/20.500.14352/51327
UL https://hdl.handle.net/20.500.14352/51327
LA eng
NO © IEEE TNS
NO Ministerio de Educación y Ciencia
NO CERN
DS Docta Complutense
RD 25 abr 2025