TY  - JOUR
AU  - Franco Peláez, Francisco Javier
AU  - Lozano Rogado, Jesús
AU  - Santos Blanco, José Pedro
AU  - Agapito Serrano, Juan Andrés
PY  - 2003
DO  - 10.1109/TNS.2003.820628
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/51327
T2  - IEEE Transactions on Nuclear Science
AB  - Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior,...
LA  - eng
M2  - 2433
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Amplification
KW  - Instrumentation amplifiers
KW  - Junction gate field effect transistors
KW  - Neutron effects
KW  - Nuclear electronics
KW  - nuclear instrumentation
KW  - operational amplifiers
KW  - COTS
KW  - JFET input stage
KW  - displacement damage
KW  - frequency behavior
KW  - gain
KW  - high temperature influence
KW  - instrumentation amplifiers degradation
KW  - large frequency bandwidth
KW  - low CMRR
KW  - neutron radiation
KW  - neutron tolerance
KW  - nonionizing energy loss damage tests
KW  - offset voltage
KW  - output saturation voltages
KW  - power consumption
KW  - quiescent current
KW  - rad-tol commercial operational amplifiers
KW  - radiation tolerance
KW  - Bandwidth
KW  - Degradation
KW  - Energy loss
KW  - Frequency
KW  - Instruments
KW  - Neutrons
KW  - Operational amplifiers
KW  - Power amplifiers
KW  - Testing
KW  - Voltage
TI  - Degradation of instrumentation amplifiers due to the nonionizing energy loss damage
TY  - journal article
VL  - 50
ER  -