%0 Journal Article
%A Piqueras De Noriega, Francisco Javier
%T Scanning electron acoustic microscopy of electronic materials
%D 1994
%@ 0921-5107
%U https://hdl.handle.net/20.500.14352/59275
%X Some scanning electron acoustic microscopy (SEAM) applications to the characterization of electronic materials are discussed. The specific problem of the observation of dislocations and dislocation-related features in GaAs is treated as an example of SEAM capability and limitations in the characterization of III-V compounds. However, SEAM is applied to study high T(c) superconductors. It is shown that evolution of the SEAM signal with temperature can provide information about structural changes above the critical temperature.
%~