TY  - JOUR
AU  - Piqueras De Noriega, Francisco Javier
PY  - 1994
DO  - 10.1016/0921-5107(94)90329-8
SN  - 0921-5107
UR  - https://hdl.handle.net/20.500.14352/59275
T2  - Materials Science and Engineering B-Solid State Materials for Advanced Technology
AB  - Some scanning electron acoustic microscopy (SEAM) applications to the characterization of electronic materials are discussed. The specific problem of the observation of dislocations and dislocation-related features in GaAs is treated as an example of...
M2  - 209
PB  - Elsevier Science SA
KW  - Signal
KW  - Gaas
TI  - Scanning electron acoustic microscopy of electronic materials
TY  - journal article
VL  - 24
ER  -