TY  - JOUR
AU  - Ruano Ramos, Óscar
AU  - Maestro De La Cuerda, Juan Antonio
AU  - Reviriego, Pedro
PY  - 2011
DO  - 10.1016/j.microrel.2011.07.020
UR  - https://hdl.handle.net/20.500.14352/110141
T2  - Microelectronics Reliability
AB  - Fault tolerance is an important factor for circuits in critical applications, especially those working in harsh environments. There are many techniques to increase reliability of circuits, being those based on redundancy very popular. In this way,...
LA  - eng
PB  - Elsevier
TI  - A fast and efficient technique to apply Selective TMR through optimization
TY  - journal article
VL  - 51
ER  -