TY  - JOUR
AU  - Franco Peláez, Francisco Javier
AU  - Clemente Barreira, Juan Antonio
AU  - Baylac, Maud
AU  - Rey, Solenne
AU  - Villa, Francesca
AU  - Mecha López, Hortensia
AU  - Agapito Serrano, Juan Andrés
AU  - Puchner, Helmut
AU  - Hubert, Guillaume
AU  - Velazco, Raoul
PY  - 2017
DO  - 10.1109/TNS.2017.2726938
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/17931
T2  - IEEE Transactions on Nuclear Science
AB  - This paper addresses a well-known problem that occurs when memories are exposed to radiation: the determination if a bitflip is isolated or if it belongs to a multiple event. As it is unusual to know the physical layout of the memory, this paper...
LA  - eng
M2  - 2152
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Multiple cell upsets
KW  - single bit upsets
KW  - single events
KW  - soft errors
KW  - SRAMs
TI  - Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs
TY  - journal article
VL  - 64
ER  -