RT Journal Article
T1 Scanning electron microscopy study of twins in ZnSe single crystals grown by solid-phase recrystallization
A1 Urbieta, C.
A1 Fernández Sánchez, Paloma
A1 Piqueras De Noriega, Francisco Javier
A1 Muñoz, V.
AB ZnSe single crystals were grown from n-type microcrystalline boules by :I solid phase recrystallization (SPR) method. During. SPP,. twinned regions appear with different electronic recombination properties. The recrystallizations were performed under different atmospheres, Ar or Se? and pressures to investigate the influence of growth conditions oil these structural features. Recombination properties were studied by means of cathodoluminescense (CL) and remote-electron beam induced current (REBIC). Wavelength dispersive X-ray (WDX) mappings were also performed to analyze possible differences in stoichiometry related to the presence of extended defects.
PB Elsevier Science Sa
SN 0921-5107
YR 2001
FD 2001-03-22
LK https://hdl.handle.net/20.500.14352/59126
UL https://hdl.handle.net/20.500.14352/59126
LA eng
NO © 2001 Elsevier Science B.V. Bi-Annual Meeting of the International Workshop on Expert  Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC 2000) (5. 2000. Heralkion, Grecia).This work was supported by CICYT (grants MAT98-0975-c02-01, 1FD97-0086 and MAT98-1306E) and DGES (grant PB96-0639).
NO CICYT
NO DGES
DS Docta Complutense
RD 8 abr 2025