RT Journal Article
T1 Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration
A1 Gálvez Alonso, Fernando
A1 Monton, C.
A1 Serrano, A., A.
A1 Valmianski, I.
A1 De la Venta, J.
A1 Schuller, Ivan K.
A1 Garcia, M. A.
AB We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also on the incidence angle. This  mplies that the photodiode sensitivity changes along the SPR curve. Consequently, the measured SPR spectrum is distorted, thus affecting fits and numerical analyses of SPR curves. We analyze the magnitude of this change, determine when it is significant, and develop a calibration method of the experimental setup which corrects for this type of spectral shape distortions.
PB Elsevier Science S A
SN 0034-6748
YR 2012
FD 2012-09
LK https://hdl.handle.net/20.500.14352/42671
UL https://hdl.handle.net/20.500.14352/42671
LA eng
NO © 2012 American Institute of Physics. Alberto Gil and Carlos Alonso are acknowledged by technical help with the experimental setup. This work was supported by CSIC (project I-LINK0400) and the Spanish Ministry of Science and innovation through the project FIS-2008-06249, Comunidad de Madrid, project NANOBIOMAGNET (S2009/MAT-1726) and AFOSR Project No. FA 9550-10-1-0409. J. de la Venta acknowledges the support of a postdoctoral fellowship from Ministry for Education of Spain.
NO Ministerio de Ciencia e Innovación (MICINN)
NO Comunidad de Madrid
NO CSIC
NO AFOSR
DS Docta Complutense
RD 16 may 2024