TY  - JOUR
AU  - Martil De La Plaza, Ignacio
AU  - González Díaz, Germán
PY  - 2002
DO  - 10.1142/S0217979202015492
SN  - 0217-9792
UR  - https://hdl.handle.net/20.500.14352/59097
T2  - International Journal of Modern Physics B
AB  - We present a micro-Raman study of alterations in InGaAs/InP epilayers after rapid thermal annealing. Defects consisting of protruding material with typical dimensions of a few microns can be observed on the surface of the annealed samples. Micro-Raman...
LA  - eng
M2  - 4401
PB  - World Scientific Publ. Co. Pte.Ltd.
KW  - Scattering
KW  - In(1-x)GaxAsyP(1-y)
KW  - InP.
TI  - Micro-Raman study of surface alterations in InGaAs after thermal annealing treatments
TY  - journal article
VL  - 16
ER  -