TY  - JOUR
AU  - García, Héctor
AU  - Castán, Helena
AU  - Dueñas, Salvador
AU  - Bailón, Luis
AU  - García Hernansanz, Rodrigo
AU  - Olea Ariza, Javier
AU  - Prado Millán, Álvaro del
AU  - Mártil de la Plaza, Ignacio
PY  - 2016
DO  - 10.1186/s11671-016-1545-z
SN  - 1556-276X
UR  - https://hdl.handle.net/20.500.14352/24594
T2  - Nanoscale research letters
AB  - A complete electrical characterization of hydrogenated amorphous silicon layers (a-Si:H) deposited on crystalline silicon (c-Si) substrates by electron cyclotron resonance chemical vapor deposition (ECR-CVD) was carried out. These structures are of...
LA  - eng
PB  - Springer
KW  - Interface
KW  - Deffects
KW  - Voltage
KW  - Layer.
TI  - Electrical characterization of amorphous silicon MIS-based structures for HIT solar cell applications
TY  - journal article
VL  - 11
ER  -