RT Journal Article
T1 Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses
A1 Balakrishnan, Narayanaswamy
A1 Castilla González, Elena María
A1 Martín Apaolaza, Nirian
A1 Pardo Llorente, Leandro
AB Introduced robust density-based estimators in the context of one-shot devices with exponential lifetimes under a single stress factor. However, it is usual to have several stress factors in industrial experiments involving one-shot devices. In this paper, the weighted minimum density power divergence estimators (WMDPDEs) are developed as a natural extension of the classical maximum likelihood estimators (MLEs) for one-shot device testing data under exponential lifetime model with multiple stresses. Based on these estimators, Wald-type test statistics are also developed. Through a simulation study, it is shown that some WMDPDEs have a better performance than the MLE in relation to robustness. Two examples with multiple stresses show the usefulness of the model and, in particular, of the proposed estimators, both in engineering and medicine.
PB Wiley
SN 0748-8017
YR 2020
FD 2020-05-20
LK https://hdl.handle.net/20.500.14352/7223
UL https://hdl.handle.net/20.500.14352/7223
LA eng
NO "This is the pre-peer reviewed version of the following article: Balakrishnan, N, Castilla, E, Martín, N, Pardo, L. Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses. Qual Reliab Engng Int. 2020; 36: 1916-1930 , which has been published in final form at https://doi.org/10.1002/qre.2665. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions."
NO Ministerio de Ciencia e Innovación (MICINN)
NO Ministerio de Educacion, Cultura y Deporte
DS Docta Complutense
RD 9 abr 2025