TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Castilla González, Elena María
AU  - Martín Apaolaza, Nirian
AU  - Pardo Llorente, Leandro
PY  - 2020
DO  - 10.1002/qre.2665
SN  - 0748-8017
UR  - https://hdl.handle.net/20.500.14352/7223
T2  - Quality and Reliability Engineering International
AB  - Introduced robust density-based estimators in the context of one-shot devices with exponential lifetimes under a single stress factor. However, it is usual to have several stress factors in industrial experiments involving one-shot devices. In this...
LA  - eng
M2  - 1916
PB  - Wiley
KW  - Exponential distribution
KW  - Minimum density power divergence estimator
KW  - Multiple stresses
KW  - One-shot devices
KW  - Robustness
KW  - Wald-type tests
TI  - Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses
TY  - journal article
VL  - 36
ER  -