RT Journal Article
T1 Silicon oxides as alignment surfaces for vertically-aligned nematics in photonic devices
A1 Otón, Eva
A1 López De Andrés, María Sol
A1 Bennis, Noureddine
A1 Otón Sánchez, José Manuel
A1 Geday, M. A.
AB A comparative study on alignment performance and microstructure of inorganic layers used for liquid crystal cell conditioning has been carried out. The study has focused on two specific materials, SiOx and SiO2, deposited under different conditions. The purpose was to establish a relationship between layer microstructure and liquid crystal alignment. The surface morphology has been studied by FESEM and AFM. An analysis on liquid crystal alignment, pretilt angle, response time, contrast ratio and the conditions to develop backflow effect (significant rise time increase due to pure homeotropic alignment) on vertically-aligned nematic cells has been carried out. A technique to overcome the presence of backflow has been identified. The full comparative study of SiOx and SiO2 layer properties and their influence over liquid crystal alignment and electrooptic response is presented
PB Springer
SN 1230-3402
YR 2014
FD 2014-06
LK https://hdl.handle.net/20.500.14352/34290
UL https://hdl.handle.net/20.500.14352/34290
LA eng
NO Ministerio de Ciencia e Innovación (MICINN)
NO Comunidad de Madrid
DS Docta Complutense
RD 26 abr 2025