RT Journal Article
T1 Proceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface
A1 Piqueras De Noriega, Francisco Javier
A1 Cremades Rodríguez, Ana Isabel
A1 Fernández Sánchez, Paloma
A1 Méndez Martín, María Bianchi
PB Academic Press Ltd- Elsevier Science Ltd
SN 0749-6036
YR 2009
FD 2009-04
LK https://hdl.handle.net/20.500.14352/43994
UL https://hdl.handle.net/20.500.14352/43994
LA eng
NO ©2008 Elsevier Ltd.
DS Docta Complutense
RD 5 abr 2025