RT Journal Article T1 Collimation method using a double grating system A1 Sánchez Brea, Luis Miguel A1 Torcal Milla, Francisco José A1 Salgado Remacha, Francisco Javier A1 Morlanes Calvo, Tomás A1 Jiménez Castillo, Isidoro A1 Bernabeu Martínez, Eusebio AB We present a collimation technique based on a double grating system to locate with high accuracy an emitter in the focal plane of a lens. Talbot self-images are projected onto the second grating producing moiré interferences. By means of two photodetectors positioned just behind the second grating, it is possible to determine the optimal position of the light source for collimation by measuring the phase shift between the signals over the two photodetectors. We obtain mathematical expressions of the signal in terms of defocus. This allows us to perform an automated technique for collimation. In addition, a simple and accurate visual criterion for collimating a light source using a lens is proposed. Experimental results that corroborate the proposed technique are also presented. PB The Optical Society Of America SN 1559-128X YR 2010 FD 2010-06-10 LK https://hdl.handle.net/20.500.14352/44286 UL https://hdl.handle.net/20.500.14352/44286 LA eng NO 1. J. Jahns and A. W. Lohmann, “The Lau effect (a diffraction experiment with incoherent illumination)” Opt. Commun. 28, 263–267 (1979). 2. K. Patorski, “The self-imaging phenomenon and its applications”, Prog. Opt. 27, 3–108 (1989). 3. S. C. Som and A. Satpathi, “The generalized Lau effect”, J. Mod. Opt. 37, 1215–1226 (1990). 4. L. Liu, “Partially coherent diffraction effect between Lau and Talbot Effects”, J. Opt. Soc. Am. A 5, 1709–1716 (1988). 5. K. V. Avudainayagam and S. Chitralekha, “Lau effect and beam collimation”, J. Mod. Opt. 44, 175–178 (1997). 6. K. V. Avudainayagam and S. Chitra Nayagam, “Two-grating diffraction and Lau effect under laser illumination”, Appl. Opt. 36, 2029–2033 (1997). [PubMed] 7. Ch. Siegel, F. Loewenthal, and J. E. Balmer, “A wavefront sensor based on the fractional Talbot effect”, Opt. Commun. 194, 265–275 (2001). 8. C. L. Hou and J. Bai, “Wavefront measurement for long focal large aperture lens based on Talbot effect of Ronchi grating”, J. Phys.: Conf. Ser. 48, 1037–1041 (2006). 9. S. Chang, “Geometrical aberrations of self.imaged line gratings”, Optik (Jena) 116, 379–389 (2005). 10. S. Yokozeki and K. Ohnishi, “Spherical aberration measurement with shearing interferometer using Fourier imaging and moiré method”, Appl. Opt. 14, 623–627, (1975). [PubMed] 11. K. Patorski, S. Yokozeki, and T. Suzuki, “Collimation test by double grating shearing interferometer”, Appl. Opt. 15, 1234–1240, (1976). [PubMed] 12. J. P. Bétend-Bon, L. Wosinski, and M. Breidne, “Double grating phase stepping interferometry for testing aspherics”, Pure Appl. Opt. 1, 55–69 (1992). 13. J. C. Bhattacharya and A. K. Aggarwal, “Measurement of the focal length of a collimating lens using the Talbot effect and the moiré technique”, Appl. Opt. 30, 4479–4480 (1991). [PubMed] 14. S. Chang and S. I. Lee, “First-order aberration of a misfocused self-imaging system”, Optik (Jena) 119, 742–748 (2008). 15. S. Rana, S. Prakash, and S. Prakash, “Automated collimation testing in Lau interferometry using phase shifting technique”, Opt. Lasers Eng. 47, 656–661 (2009). 16. D. Joeux and Y. Cohen-Sabban, “High magnification self-imaging”, Appl. Opt. 21, 625–627 (1982). 17. Y. Cohen-Sabban and D. Joyeux, “Aberration-free nonparaxial self-imaging”, J. Opt. Soc. Am. 73, 707–719 (1983). 18. S. Szapiel and K. Patorski, “Fresnel diffraction images of periodic objects under Gaussian beam illumination”, Opt. Acta 26, 439–446 (1979). 19. L. M. Sánchez-Brea, J. Sáenz-Landete, J. Alonso, and E. Bernabéu, “Invariant grating pseudo-imaging using polychromatic light and finite extension source”, Appl. Opt. 47, 1470–1477 (2008). NO © 2010 Optical Society of America.This research has been supported by project CCG08-UCM/DPI-3952 of Dirección General de Universidades e Investigación de la Consejería de Educación de la Comunidad de Madrid and by project DPI2008-02391 of the Ministerio de Ciencia e Innovación of Spain. NO Dirección General de Universidades e Investigación de la Consejería de Educación de la Comunidad de Madrid NO Ministerio de Ciencia e Innovación (MICINN), España DS Docta Complutense RD 27 jul 2024