TY  - JOUR
AU  - Nogales Díaz, Emilio
AU  - Méndez Martín, María Bianchi
AU  - Piqueras De Noriega, Francisco Javier
AU  - Plugaru, R
PY  - 2001
DO  - 10.1088/0268-1242/16/9/309
SN  - 0268-1242
UR  - https://hdl.handle.net/20.500.14352/58934
T2  - Semiconductor Science and Technology
AB  - Scanning tunnelling microscopy (STM) has been sometimes applied in recent years to characterize porous silicon. In contrast, other forms of light emitting Si, such as nanocrystalline silicon films, prepared by different methods, have not been, or are...
LA  - eng
M2  - 789
PB  - Iop Publishing Ltd
KW  - Semiconductors
KW  - Luminescence
KW  - Photoluminescence
KW  - Silicon
TI  - Scanning tunnelling microscopy and spectroscopy of nanocrystalline silicon films
TY  - journal article
VL  - 16
ER  -