RT Journal Article
T1 Modification of the LM124 single event transients by load resistors
A1 Franco Peláez, Francisco Javier
A1 López Calle, Isabel
A1 González Izquierdo, Jesús
A1 Agapito Serrano, Juan Andrés
AB The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 0018-9499
YR 2010
FD 2010-02
LK https://hdl.handle.net/20.500.14352/44473
UL https://hdl.handle.net/20.500.14352/44473
LA eng
NO (c) 2010 IEEE. Personal use of this material is ermitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
DS Docta Complutense
RD 8 abr 2025