TY  - JOUR
AU  - Franco Peláez, Francisco Javier
AU  - López Calle, Isabel
AU  - González Izquierdo, Jesús
AU  - Agapito Serrano, Juan Andrés
PY  - 2010
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/44473
T2  - IEEE transactions on nuclear science
AB  - The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the...
LA  - eng
M2  - 358
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - SPICE
KW  - Operational amplifiers
KW  - Resistors
KW  - LM124 Operational amplifier
KW  - SPICE Simulation
KW  - Distortion
KW  - Feedback network
KW  - Laser test
KW  - Load effect
KW  - Load resistor
KW  - Single event transients
KW  - Absorption
KW  - Critical current
KW  - Laser noise
KW  - Optical pulse generation
KW  - Pulse amplifiers
KW  - Shape
KW  - Testing
KW  - LM124
KW  - Laser irradiation
KW  - Load effects
KW  - Operational amplifier
KW  - Two-photon absorption
TI  - Modification of the LM124 single event transients by load resistors
TY  - journal article
VL  - 57
ER  -