TY  - JOUR
AU  - Urbieta Quiroga, Ana Irene
AU  - Fernández Sánchez, Paloma
AU  - Piqueras De Noriega, Francisco Javier
AU  - Vasco, E.
AU  - Zaldo, C.
PY  - 2004
SN  - 1454-4164
UR  - https://hdl.handle.net/20.500.14352/51146
T2  - Journal of Optoelectronics and advanced materials
AB  - Scanning tunnelling microscopy and spectroscopy have been used to characterize electrically active grain boundaries in pulsed laser deposited ZnO films with grain sizes in the range 216-500 nm. The p-type behaviour at the boundary is evidenced by...
M2  - 183
PB  - Natl Inst Optoelectronics
KW  - Zinc-Oxide
KW  - Grain-Boundaries
KW  - Spectroscopy
KW  - Ceramics
TI  - Nanoscopic study of ZnO films by electron beam induced current in the scanning tunneling microscope
TY  - journal article
VL  - 6
ER  -