RT Journal Article
T1 Cathodoluminescence enhancement in porous silicon cracked in vacuum
A1 Rams, J.
A1 Méndez Martín, María Bianchi
A1 Craciun, G.
A1 Plugaru, R.
A1 Piqueras De Noriega, Francisco Javier
AB An increase of the cathodoluminescence (CL) signal of porous silicon (PS) cracked in vacuum of up to three orders of magnitude has been achieved. Under high electron-beam currents, the samples cracked in interconnected pieces of tens of microns, exposing new surfaces to the electron beam. This treatment enhances the radiative intensity in PS associated with a broadband peaked at 720 nm, which is highly stable while the sample is kept in vacuum. Cross-sectional CL observations show that most of the light is generated in the top surface of the porous layer. The spectral depth dependence of the emitted light reveals a relatively weak blue emission in the region closer to the substrate.
PB Amer Inst Physics
SN 0003-6951
YR 1999
FD 1999-03-22
LK https://hdl.handle.net/20.500.14352/58944
UL https://hdl.handle.net/20.500.14352/58944
LA eng
NO © 1999 American Institute of Physics.This work was supported by the DGES (Project No.PB96-0639) and by the Scientific Cooperation Programme between Spain and Romania.
NO DGES
NO Scientific Cooperation Programme between Spain and Romania
DS Docta Complutense
RD 9 abr 2025