RT Journal Article
T1 FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps
A1 Palais, O.
A1 Hidalgo Alcalde, Pedro
A1 Martinuzzi, S.
AB The kinetics of "metal-acceptor" pairing in boron-doped multicrystalline samples are investigated by means of contactless lifetime measurement. The case of FeB and CrB pairs is discussed and the influence of extended defect is evidenced for FeB. It is found that the reassociation of the "metal-acceptor" pairs is fast immediately after the dissociation and then slows down for several days. The results allow the identification of mixed contamination by Cr and Fe.
PB E D P Sciences
SN 1286-0042
YR 2004
FD 2004-07
LK https://hdl.handle.net/20.500.14352/51059
UL https://hdl.handle.net/20.500.14352/51059
NO © E D P Sciences.International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10) (10. 2003. Batz sur Mer, Francia)
DS Docta Complutense
RD 27 mar 2026