RT Book, Section
T1 Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
A1 Morlanes Calvo, Tomás
A1 Peña, José Luis de la
A1 Sánchez Brea, Luis Miguel
A1 Alonso Fernández, José
A1 Crespo Vázquez, Daniel
A1 Saez Landete, José
A1 Bernabeu Martínez, Eusebio
A2 Badenes, Goncal
A2 Abbott, Derek
A2 Serpenguzel, Ali
AB In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.
PB Society of Photo-Optical Instrumentation Engineers (SPIE)
SN 0-8194-5835-X
YR 2005
FD 2005
LK https://hdl.handle.net/20.500.14352/53384
UL https://hdl.handle.net/20.500.14352/53384
NO © (2005) SPIE--The International Society for Optical Engineering.Conference on Photonic Materials, Devices and Applications (2005. Sevilla, España)
DS Docta Complutense
RD 23 jul 2024