TY  - CHAP
AU  - Morlanes Calvo, Tomás
AU  - Peña, José Luis de la
AU  - Sánchez Brea, Luis Miguel
AU  - Alonso Fernández, José
AU  - Crespo Vázquez, Daniel
AU  - Saez Landete, José
AU  - Bernabeu Martínez, Eusebio
A4  - Badenes, Goncal
A4  - Abbott, Derek
A4  - Serpenguzel, Ali
PY  - 2005
DO  - 10.1117/12.628135
SN  - 0-8194-5835-X
UR  - https://hdl.handle.net/20.500.14352/53384
AB  - In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after...
M2  - 862
PB  - Society of Photo-Optical Instrumentation Engineers (SPIE)
KW  - LAU
KW  - Encoder
TI  - Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
TY  - book part
VL  - 1-2
ER  -