RT Book, Section
T1 Application of cathodoluminescence microscopy to the study of native acceptors in gallium antimonide
A1 Piqueras De Noriega, Francisco Javier
A1 Méndez Martín, María Bianchi
A1 Panin, G. N.
A1 Dutta, P. S.
A1 Dieguez, E.
AB Cathodoluminescence in the scanning electron microscope is used to ivestigate growth and prosess induced defects in GaSb crystals. In particular, luminescence emission has been used to study the nature of acceptor defects present after different annealing and irradiation treatments.
PB I E E E
SN 0-7803-3223-7
YR 1996
FD 1996
LK https://hdl.handle.net/20.500.14352/60822
UL https://hdl.handle.net/20.500.14352/60822
LA eng
NO © 1996 IEEE.1996 International Semiconductor Conference (CAS 96) (1996.Sinaia, Romania)
DS Docta Complutense
RD 8 abr 2025