TY  - CHAP
AU  - Piqueras De Noriega, Francisco Javier
AU  - Méndez Martín, María Bianchi
AU  - Panin, G. N.
AU  - Dutta, P. S.
AU  - Dieguez, E.
PY  - 1996
SN  - 0-7803-3223-7
UR  - https://hdl.handle.net/20.500.14352/60822
AB  - Cathodoluminescence in the scanning electron microscope is used to ivestigate growth and prosess induced defects in GaSb crystals. In particular, luminescence emission has been used to study the nature of acceptor defects present after different...
LA  - eng
M2  - 497
PB  - I E E E
KW  - Engineering
KW  - Electrical & Electronic
TI  - Application of cathodoluminescence microscopy to the study of native acceptors in gallium antimonide
TY  - book part
VL  - 1 y 2
ER  -