TY  - JOUR
AU  - Ruano Ramos, Óscar
AU  - Maestro De La Cuerda, Juan Antonio
AU  - Reviriego, Pedro
PY  - 2009
DO  - 10.1109/TNS.2009.2014563
UR  - https://hdl.handle.net/20.500.14352/110015
T2  - IEEE Transactions on Nuclear Science
AB  - In this paper, a methodology to perform automatic selective TMR insertion on digital circuits is presented, having as a constraint the required reliability level. Such reliability is guaranteed while reducing the area compared to TMR. In addition, a...
LA  - eng
M2  - 2091
PB  - IEEE
TI  - A methodology for automatic insertion of selective TMR in digital circuits affected by SEUs
TY  - journal article
VL  - 56
ER  -