TY  - JOUR
AU  - Pal, U.
AU  - Piqueras De Noriega, Francisco Javier
AU  - Fernández Sánchez, Paloma
AU  - Serrano, M. D.
AU  - Diéguez, E.
PY  - 1994
DO  - 10.1063/1.357442
SN  - 0021-8979
UR  - https://hdl.handle.net/20.500.14352/59271
T2  - Journal of Applied Physics
AB  - Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing...
LA  - eng
M2  - 3720
PB  - American Institute of Physics
KW  - Physics
KW  - Applied
TI  - Study of point defects in CdTe and CdTe:V by cathodoluminescence
TY  - journal article
VL  - 76
ER  -