RT Journal Article
T1 Comparison between optical techniques and confocal microscopy for defect detection on thin wires
A1 Siegmann, Philip
A1 Sánchez Brea, Luis Miguel
A1 Martínez Antón, Juan Carlos
A1 Bernabeu Martínez, Eusebio
AB Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical techniques have been developed to be used for those tasks. However, they need a rigorous validation. In this work, we have used confocal microscopy to obtain the topography z(x,y) of wires with longitudinal defects, such as dielines. The topography has been used to predict the light scattered by the wire. These simulations have been compared with experimental results, showing a good agreement.
PB Elsevier Science B. V.
SN 0169-4332
YR 2004
FD 2004-11-15
LK https://hdl.handle.net/20.500.14352/51200
UL https://hdl.handle.net/20.500.14352/51200
LA eng
NO © 2004 Elsevier B.V.The authors thank Javier Alda for his valuable suggestions. This article is financed with DPI2001-1238 project.
NO Ministerio de Ciencia y Tecnología (MCYT), España
DS Docta Complutense
RD 17 dic 2025