TY  - JOUR
AU  - Siegmann, Philip
AU  - Sánchez Brea, Luis Miguel
AU  - Martínez Antón, Juan Carlos
AU  - Bernabeu Martínez, Eusebio
PY  - 2004
DO  - 10.1016/j.apsusc.2004.05.240
SN  - 0169-4332
UR  - https://hdl.handle.net/20.500.14352/51200
T2  - Applied Surface Science
AB  - Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical...
LA  - eng
M2  - 375
PB  - Elsevier Science B. V.
KW  - Surface-Deffects
TI  - Comparison between optical techniques and confocal microscopy for defect detection on thin wires
TY  - journal article
VL  - 238
ER  -