RT Journal Article
T1 Cathodoluminescence and photoinduced current spectroscopy studies of defects in Cd_(0.8)Zn_(0.2)Te
A1 Castaldini, A.
A1 Cavallini, A.
A1 Fraboni, B.
A1 Polenta, L.
A1 Fernández Sánchez, Paloma
A1 Piqueras De Noriega, Francisco Javier
AB Deep levels in Cd_(1-x)Zn_xTe have not yet been fully characterized and understood, even though this material is very promising for medical and optoelectronic applications. We have investigated p-type semi-insulating Cd_(0.8)Zn_(0.2)Te with cathodoluminescence (CL) and photoinduced current transient spectroscopy (PICTS) methods. PICTS analyses allow detection of deep levels which are not revealed by other current spectroscopy techniques generally used, as they permit scanning of a wider region of the energy gap. Five levels have been detected (0.16, 0.25, 0.57, 0.78, and 1.1 eV) and, by combining the results obtained with the above-mentioned CL techniques, we were able to advance hypotheses on the character (donor or acceptor) and origin of some of these levels. The key role prayed by the 0.78-eV level in controlling the carrier transport properties has also been confirmed.
PB American Physical Society
SN 1098-0121
YR 1996
FD 1996-09-15
LK https://hdl.handle.net/20.500.14352/59207
UL https://hdl.handle.net/20.500.14352/59207
LA eng
NO © 1996 The American Physical Society.This research has been partially supported by the coperation Programme ‘‘Azione  Integrata’’ between Italy and Spain and by DGICYT (Project No. PB93-1256).The authors are indebted to Professor F. Casali for providing thesamples.
NO DGICYT
DS Docta Complutense
RD 4 abr 2025