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T1 Phase imaging methods in the scanning transmission electron microscope
A1 Sánchez Santolino, Gabriel
A1 Clark, Laura
A1 Toyama, Satoko
A1 Seki, Takehito
A1 Shibata, Naoya
AB Scanning transmission electron microscopy (STEM) has become an essential tool for investigating materials, providing detailed characterization at nano and atomic scales. By combining subangstrom resolution Z-contrast imaging with analytical X-ray and electron spectroscopies, STEM allows the visualization of atomic arrangements, crystal defects, and interfaces, understanding sample properties and correlating these with the functionalities of materials and devices. Recent advancements in phase imaging techniques, including differential phase contrast (DPC) and electron ptychography, have further enhanced STEM capabilities. These methods allow direct imaging of electromagnetic fields, the study of beam-sensitive materials with high dose efficiency, or resolving the 3D structure of materials, proving invaluable for investigating intricate nanoscale phenomena. This review introduces phase imaging methods in the STEM and explores how the most recent innovations are driving progress in nanoscience, deepening material insights and shaping next-generation applications in electronics, energy storage, and catalysis.
PB American Chemical Society
SN 1530-6984
YR 2025
FD 2025-06-28
LK https://hdl.handle.net/20.500.14352/123720
UL https://hdl.handle.net/20.500.14352/123720
LA eng
NO Sanchez-Santolino, G.; Clark, L.; Toyama, S.; Seki, T.; Shibata, N. Phase Imaging Methods in the Scanning Transmission Electron Microscope. Nano Lett. 2025, 25 (27), 10709–10721. https://doi.org/10.1021/acs.nanolett.4c06697.
NO Copyright © 2025 The Authors. Published by American Chemical SocietyRYC2022-038027-I
NO Ministry of Education, Culture, Sports, Science and Technology (Japan)
NO Japan Science and Technology Agency
NO Japan Society for the Promotion of Science
NO Ministerio de Innovación y Ciencia (España)
NO Agencia Estatal de Investigación (España)
NO European Commission
NO Universidad Complutense de Madrid
DS Docta Complutense
RD 31 dic 2025