TY  - GEN
AU  - Sánchez Santolino, Gabriel
AU  - Clark, Laura
AU  - Toyama, Satoko
AU  - Seki, Takehito
AU  - Shibata, Naoya
PY  - 2025
DO  - 10.1021/acs.nanolett.4c06697
SN  - 1530-6984
UR  - https://hdl.handle.net/20.500.14352/123720
T2  - Nano Letters
AB  - Scanning transmission electron microscopy (STEM) has become an essential tool for investigating materials, providing detailed characterization at nano and atomic scales. By combining subangstrom resolution Z-contrast imaging with analytical X-ray and...
LA  - eng
M2  - 10709
PB  - American Chemical Society
KW  - Scanning transmission electron microscopy
KW  - Phase imaging
KW  - Differential phase contrast
KW  - Ptychography
KW  - 4D-STEM
TI  - Phase imaging methods in the scanning transmission electron microscope
TY  - review article
VL  - 25
ER  -