%0 Book Section
%T Neutron-Induced single events in a COTS soft-error free SRAM at low bias voltage
publisher IEEE-Inst Electrical Electronics Engineers Inc
%D 2015
%U 978-1-5090-0232-0
%@ https://hdl.handle.net/20.500.14352/24709
%X This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage of advanced low-power SRAMs by Renesas Electronics. The most interesting results are the occurrence of clusters of bitflips, hard errors only visible at low voltage, appearing along with single event upsets. The physical mechanisms are briefly discussed.
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