TY  - CHAP
AU  - Clemente Barreira, Juan Antonio
AU  - Franco Peláez, Francisco Javier
AU  - Vila, Francesca
AU  - Baylac, Maud
AU  - Ramos Vargas, Pablo Francisco
AU  - Vargas Vallejo, Vanessa Carolina
AU  - Mecha López, Hortensia
AU  - Agapito Serrano, Juan Andrés
AU  - Velazco, Raoul
PY  - 2015
DO  - 10.1109/RADECS.2015.7365640
SN  - 978-1-5090-0232-0
UR  - https://hdl.handle.net/20.500.14352/24709
AB  - This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage of advanced low-power SRAMs by Renesas Electronics. The most interesting results are the occurrence of clusters of bitflips, hard errors only visible...
LA  - eng
M2  - 162
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - COTS
KW  - LPSRAM
KW  - Neutron tests
KW  - Radiation hardness
KW  - Reliability
KW  - Soft error
KW  - SRAM
TI  - Neutron-Induced single events in a COTS soft-error free SRAM at low bias voltage
T2  - Sucesos Aislados inducidos por neutrones en una memoria estática de acceso aleatorio comercial a tensiones ultrabajas
TY  - book part
ER  -