RT Journal Article
T1 X-Ray reflectivity of fibonacci multilayers
A1 Domínguez-Adame Acosta, Francisco
A1 Maciá Barber, Enrique Alfonso
AB We have numerically computed the reflectivity of X-rays incident normally onto Fibonacci multilayers, and compared the results with those obtained in periodic approximant multilayers. The constituent layers are of low and high refractive indices with the same thickness. Whereas the reflectivity of periodic approximant multilayers changes only slightly with increasing the number of layers, Fibonacci multilayers present a completely different behaviour. In particular, we have found a highly fragmented and self-similar reflectivity pattern in Fibonacci systems. The behaviour of the fragmentation pattern on increasing the number of layers is quantitatively described using multifractal techniques. We end with a brief discussion on possible practical applications of our results in the design of new X-ray devices.
PB Elsevier
SN 0375-9601
YR 1995
FD 1995-04-10
LK https://hdl.handle.net/20.500.14352/59378
UL https://hdl.handle.net/20.500.14352/59378
LA eng
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NO © Elsevier.This work has been supported by UCM under project PR161/93-4811.
NO UCM
DS Docta Complutense
RD 27 abr 2024