TY  - JOUR
AU  - González Díaz, Germán
AU  - Pastor, D.
AU  - García Hemme, Eric
AU  - Montero, Daniel
AU  - García Hernansanz, Rodrigo
AU  - Olea Ariza, Javier
AU  - Prado Millán, Álvaro Del
AU  - San Andrés Serrano, Enrique
AU  - Martil De La Plaza, Ignacio
PY  - 2017
DO  - 10.1016/j.measurement.2016.11.040
SN  - 0263-2241
UR  - https://hdl.handle.net/20.500.14352/17787
T2  - Measurement
AB  - The van der Pauw method to calculate the sheet resistance and the mobility of a semiconductor is a pervasive technique both in the microelectronics industry and in the condensed matter science field. There are hundreds of papers dealing with the...
LA  - eng
M2  - 151
PB  - Elsevier Sci. Ltd
KW  - Resistivity
TI  - A robust method to determine the contact resistance using the van der Pauw set up
TY  - journal article
VL  - 98
ER  -