TY  - JOUR
AU  - Quiroga Mellado, Juan Antonio
AU  - Vargas Balbuena, Javier
AU  - Koninckx, Thomas
AU  - Van Gool, Luc
PY  - 2008
DO  - 10.1117/1.2919726
SN  - 0091-3286
UR  - https://hdl.handle.net/20.500.14352/50784
T2  - Optical Engineering
AB  - The industry dealing with microchip inspection requires fast, flexible, repeatable, and stable 3-D measuring systems. The typical devices used for this purpose are coordinate measurement machines (CMMs). These systems have limitations such as high...
PB  - Spie-Soc Photo-Optical Instrumentation Engineers
KW  - Calibration
KW  - High Dynamic-Range Imaging
KW  - Active Three-Dimensional Measure
KW  - Microchip Inspection
TI  - Three-dimensional measurement of microchips using structured light techniques
TY  - journal article
VL  - 47
ER  -