RT Book, Section
T1 Two-photon absorption (TPA) backside pulsed laser tests in the LM324
A1 López Calle, Isabel
A1 Franco Peláez, Francisco Javier
A1 González Izquierdo, Jesús
A1 Agapito Serrano, Juan Andrés
AB Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 978-1-4577-0492-5
YR 2009
FD 2009-09-14
LK https://hdl.handle.net/20.500.14352/45550
UL https://hdl.handle.net/20.500.14352/45550
LA eng
NO S. Buchner, J. J. Howard, C. Poivey, D. McMorrow and R. Pease, "Pulsed-laser testing methodology for single event transients in linear devices", IEEE Transactions on Nuclear Science, Vol. 51, pp. 3716-3722, Dec. 2004. Sternberg, A. L.; Massengill, L. W.; Buchner, S.; Pease, R. L.; Boul-ghassoul, Y.; Savage, M. W.; McMorrow, D. and Weller, R. A. "The role of parasitic elements in the single-event transient response of linear circuits", IEEE Transactions on Nuclear Science, Vol. 49, pp. 3115-3120, Dec. 2002. Buchner, S.; McMorrow, D.; Poivey, C.; Howard, J. J.; Boulghassoul, Y.; Massengill, L. W.; Pease, R. & Savage, M., "Comparison of singleevent transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions", IEEE Transactions on Nuclear Science, Vol. 51, pp. 2776-2781, Dec. 2004. McMorrow, D.; Lotshaw, W. T.; Melinger, J. S.; Buchner, S.; Boulghas-soul, Y.; Massengill, L. W. & Pease, R. L., "Three-dimensional mapping of single-event effects using two photon absorption", IEEE Transactions on Nuclear Science, Vol. 50, pp. 2199-2207, Dec. 2003. McMorrow, D.; Lotshaw, W. T.; Melinger, J. S.; Buchner, S. & Pease, R. L., "Subbandgap laser-induced single event effects: carrier generation via two-photon absorption", IEEE Transactions on Nuclear Science, Vol. 49, pp. 3002-3008, Dec. 2002. A. Akkerman and J. Barack, "Ion-track structure and its effects in small size volumes of silicon" IEEE Transactions on Nuclear Science, vol.49, pp.3022-3031, December 2002. R. Pease, "Modeling single event transients in bipolar linear circuits, "Nuclear Science, IEEE Transactions on Nuclear Science, vol. 55, no. 4, pp. 1879-1890, Aug. 2008. Savage, M.W.; Turflinger, T.; Titus, J.L.; Barsun, H.F.; Sternberg, A.; Boulghassoul, Y.; Massengill, L.W., "Variations in SET pulse shapes in the LM124A and LM111," Radiation Effects Data Workshop, pp. 75-81, 2002. D. Lewis et al., "Backside laser testing of ICs for SET sensitivity evaluation", IEEE Transactions on Nuclear Science, vol. 48, no. 6, p.2193, Dec. 2001
NO © IEEE.© 2011 Elsevier B.V.ISSN : 0379-6566 E-ISBN : 978-1-4577-0493-2European Conference on Radiation and its Effects on Components and Systems (RADECS 2009) (10. 2009. Bruges, Bélgica)
NO Ministerio de Educación y Ciencia
DS Docta Complutense
RD 4 may 2024