TY  - CHAP
AU  - López Calle, Isabel
AU  - Franco Peláez, Francisco Javier
AU  - González Izquierdo, Jesús
AU  - Agapito Serrano, Juan Andrés
PY  - 2009
DO  - 10.1109/RADECS.2009.5994568
SN  - 978-1-4577-0492-5
UR  - https://hdl.handle.net/20.500.14352/45550
AB  - Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
LA  - eng
M2  - 138
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Absorption
KW  - Operational amplifiers
KW  - Two-photon processes
KW  - LM324
KW  - TPA backside pulsed laser test
KW  - UCM
KW  - Operational amplifier
KW  - Surface XY scan
KW  - Two-photon absorption backside pulsed laser test
KW  - Lasers
KW  - Measurement by laser beam
KW  - Photonics
KW  - Radiation effects
KW  - Transient analysis
KW  - Transistors
KW  - Laser
KW  - Operational Amplifiers
KW  - Single Event Transients
KW  - Two-Photon Tests
TI  - Two-photon absorption (TPA) backside pulsed laser tests in the LM324
TY  - book part
ER  -