TY  - JOUR
AU  - Clemente Barreira, Juan Antonio
AU  - Franco Peláez, Francisco Javier
AU  - Villa, Francesca
AU  - Baylac, Maud
AU  - Ramos Vargas, Pablo Francisco
AU  - Vargas Vallejo, Vanessa Carolina
AU  - Mecha López, Hortensia
AU  - Agapito Serrano, Juan Andrés
AU  - Velazco, Raoul
PY  - 2016
DO  - 10.1109/TNS.2016.2522819
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/18945
T2  - IEEE Transactions on Nuclear Science
AB  - This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low Power SRAMs (A-LPSRAM) at low bias voltage little above the threshold value that allows the retention of data.  This family of memories is characterized by...
LA  - eng
M2  - 2072
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - COTS
KW  - LPSRAM
KW  - Neutron tests
KW  - radiation hardness
KW  - reliability
KW  - soft error
KW  - SRAM
KW  - CMOS integrated
KW  - Power supplies
KW  - Random access memory
TI  - Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons
TY  - journal article
VL  - 63
ER  -