TY  - JOUR
AU  - Panin, G. N.
AU  - Díaz-Guerra Viejo, Carlos
AU  - Piqueras De Noriega, Francisco Javier
PY  - 1998
DO  - 10.1088/0268-1242/13/6/007
SN  - 0268-1242
UR  - https://hdl.handle.net/20.500.14352/59141
T2  - Semiconductor Science and Technology
AB  - A combined scanning electron microscope-scanning tunnelling microscope (SEM-STM) system has been used to characterize CdxHg1-xTe and CdTe crystals, The electron beam induced current (EBIC) mode of the SEM shows the existence of inhomogeneities in the...
LA  - eng
M2  - 576
PB  - Iop Publishing Ltd
KW  - Imaging Tunneling Spectroscopy
KW  - Si(111)2x1 Surface
KW  - Microscopy
KW  - Cathodoluminescence
KW  - Cdte(001)
KW  - Defects
TI  - Electron beam induced current and scanning tunnelling spectroscopy correlative study of Cd-xHg_(1-x)Te and CdTe crystals
TY  - journal article
VL  - 13
ER  -