RT Journal Article
T1 Influence of Randomness during the Interpretation of Results from Single-Event Experiments on SRAMs
A1 Franco Peláez, Francisco Javier
A1 Clemente Barreira, Juan Antonio
A1 Mecha López, Hortensia
A1 Velazco, Raoul
AB After having carried out radiation experiments on memories, the detected bitflips must be classified into single bit upsets and multiple events to calculate the cross sections of different phenomena. There are some accepted procedures to determine if two bitflips are related. However, if there are enough bitflips, it is possible that unrelated pairs of errors appear in nearby cells and they are erroneously taken as a multiple event. In this paper, radiation experiments are studied as a special case of the urn-and-balls problem in probability theory to estimate how the measured multiple-event cross sections must be corrected to remove the overestimation due to the false events.
PB IEEE
SN 1530-4388
YR 2019
FD 2019-03-01
LK https://hdl.handle.net/20.500.14352/12942
UL https://hdl.handle.net/20.500.14352/12942
LA eng
NO © 2018 IEEEThis work was supported in part by the Spanish MINECO projects FPA2015-69210-C6-5-R and TIN2017-87237-P, and by the UCM mobility program for young professors.
NO Ministerio de Economía y Competitividad (MINECO)
NO Universidad Complutense de Madrid
DS Docta Complutense
RD 20 dic 2025