RT Conference Proceedings
T1 Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y tests experimentales
A1 Velazco, Raoul
AB This work presents an approach to predict the error rate due to Single Event Upsets (SEU), which are errors changing de content of memory cells, occurring in programmable circuits as the consequence of the impact of an energetic particle (heavy ion, proton, neutron,...) present in the environment where the circuits operates (space, earth's atmosphere, nuclear plants,...). For a chosen application, the error-rate is predicted by combining the DUT (Device Under Test) static SEU cross-section obtained from experiments performed in particle accelerators, and the results of fault injection campaigns performed off-beam during which huge number of SEUs are injected during the execution of the studied application. This methodology will be illustrated for a processor and a SRAM-based FPGA
YR 2013
FD 2013-06-07
LK https://hdl.handle.net/20.500.14352/36053
UL https://hdl.handle.net/20.500.14352/36053
NO Ciclo de conferencias del Máster en Investigación en Informática , coordinado por Narciso Martí Oliet
DS Docta Complutense
RD 6 abr 2025