TY  - CONF
AU  - Velazco, Raoul
PY  - 2013
UR  - https://hdl.handle.net/20.500.14352/36053
AB  - This work presents an approach to predict the error rate due to Single Event Upsets (SEU), which are errors changing de content of memory cells, occurring in programmable circuits as the consequence of the impact of an energetic particle (heavy ion,...
KW  - Radiación
KW  - Circuitos integrados digitales
KW  - Efectos de la radiación
KW  - Digital integrated circuits
KW  - Effect of radiation on
KW  - Radiation
TI  - Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y tests experimentales
TY  - conference output
ER  -