TY  - CHAP
AU  - Velazco, Raoul
AU  - Franco Peláez, Francisco Javier
PY  - 2007
DO  - 10.1109/ISIE.2007.4375148
SN  - 978-1-4244-0755-2 (E-ISBN) ; 978-1-4244-0754-5 (Print ISBN)
UR  - https://hdl.handle.net/20.500.14352/53389
AB  - New generation electronic devices have become more and more sensitive to the effects of the natural radiation coming from the surrounding environment. These radiation sources are cosmic rays and radioactive impurities, able to corrupt the content of...
LA  - eng
M2  - 3322
PB  - IEEE
KW  - Digital integrated circuits
KW  - Radiation hardening (electronics)
KW  - Combinational logic
KW  - Cosmic rays
KW  - Electronic devices
KW  - Induce transient pulses
KW  - Memory cells
KW  - Radiation sources
KW  - Radioactive impurities
KW  - Single event effects
KW  - Circuit testing
KW  - Failure analysis
KW  - Impurities
KW  - Laboratories
KW  - Logic circuits
KW  - Logic devices
KW  - Single event upset
KW  - System testing
TI  - Single event effects on digital integrated circuits: origins and mitigation techniques
TY  - book part
ER  -