TY  - CHAP
AU  - Martínez Antón, Juan Carlos
AU  - Siegmann, Philip
AU  - Sánchez Brea, Luis Miguel
AU  - Gómez Pedrero, José Antonio
AU  - Canabal Boutureira, Héctor Alfonso
AU  - Bernabéu Martínez, Eusebio
A4  - Hoefling, Roland
A4  - Jueptner, Werner P. O.
A4  - Kujawinska, Malgorzata
PY  - 2001
DO  - 10.1117/12.445586
SN  - 0-8194-4094-9
UR  - https://hdl.handle.net/20.500.14352/60856
AB  - We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity...
M2  - 27
PB  - The International Society for Optical Engineering (SPIE)
KW  - Quality Control
KW  - Wire
KW  - Conical Reflection
TI  - In-line detection and evaluation of surface defects on thin metallic wires
TY  - book part
ER  -