TY  - JOUR
AU  - Rodriguez Schwendtner, Eva María
AU  - Álvarez Herrero, Alberto
AU  - Mariscal Jiménez, Antonio
AU  - Serna Galán, Rosalía
AU  - González Cano, Agustín
AU  - Navarrete Fernández, María Cruz
AU  - Díaz Herrera, Natalia
PY  - 2019
DO  - 10.1116/1.5121590
SN  - 2166-2746
UR  - https://hdl.handle.net/20.500.14352/5999
T2  - Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
AB  - The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by...
LA  - eng
M2  - 062914
PB  - AVS Science and Technology Society; American Vacuum Society
KW  - Surface plasmon resonance
KW  - Resonance sensor
KW  - Optical fibers
KW  - Spectroscopic ellipsometry
KW  - Pulsed laser deposition
TI  - Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor
TY  - journal article
VL  - 37
ER  -